Easypix microscope Instrucciones de operaciones

Busca en linea o descarga Instrucciones de operaciones para Microscopios Easypix microscope. Easypix microscope Operating instructions Manual de usuario

  • Descarga
  • Añadir a mis manuales
  • Imprimir
  • Pagina
    / 73
  • Tabla de contenidos
  • MARCADORES
  • Valorado. / 5. Basado en revisión del cliente
Vista de pagina 0
Operating Instructions
easyScan 2 AFM
Version 1.3
Vista de pagina 0
1 2 3 4 5 6 ... 72 73

Indice de contenidos

Pagina 1 - Version 1.3

Operating InstructionseasyScan 2 AFMVersion 1.3

Pagina 2

THE EASYSCAN 2 AFM10User inputs can optionally be measured in all Imaging and Spectroscopy modes.User outputs can be modulated in Spectroscopy measure

Pagina 3

FEATURES11Compatible cantileversAFM Basic ModuleThe AFM Basic Module is required for using AFM Scan Heads.AFM Dynamic ModuleThe AFM Basic Module is re

Pagina 4 - Table of contents

THE EASYSCAN 2 AFM12Both the AFM Basic Module and the AFM Dynamic Module are required for using the AFM Mode Extension Module.AFM Video ModuleMicromet

Pagina 5

COMPONENTS OF THE SYSTEM132. USB cable3. Mains cable4. easyScan 2 AFM Scan head(s) with AFM Video Camera (with AFM Video Module)5. Scan head case6. Sc

Pagina 6 - About this Manual

THE EASYSCAN 2 AFM1413. AFM Sample Stage (option)14. Micrometre Translation Stage (option)15. User's Guide; Translation Stage, Model: 9064 (with

Pagina 7 - The easyScan 2 AFM

CONNECTORS, INDICATORS AND CONTROLS154. Screwdriver, 2.3 mm5. Cantilever insertion tool (usually mounted in DropStop6. DropStop)7. Sample holder (with

Pagina 8 - Features

THE EASYSCAN 2 AFM16The ControllerStatus lightsAll status lights on top of the Controller will light up for one second when the power is turned on.The

Pagina 9 - Computer requirements

CONNECTORS, INDICATORS AND CONTROLS17point for some time. The tip is probably not in contact with the sample surface.green The scanner is not in a lim

Pagina 10 - AFM Measurement

INSTALLING THE EASYSCAN 2 AFM18Installing the easyScan 2 AFMThe following sections describe the installation of the easyScan 2 AFM.Important!To make h

Pagina 11 - AFM Mode Extension Module

INSTALLING THE HARDWARE19It is recommended to cover the instrument with a box to shield it from near infrared light from artificial light sources, bec

Pagina 12 - Components of the System

‘NANOSURF’ AND THE NANOSURF LOGO ARE TRADEMARKS OF NANOSURF AG, REGIS-TERED AND/OR OTHERWISE PROTECTED IN VARIOUS COUNTRIES.© SEPTEMBER 05 BY NANOSUR

Pagina 13 - COMPONENTS OF THE SYSTEM

INSTALLING THE EASYSCAN 2 AFM20Installing the AFM Video Module- Connect the Video Camera cable to the connector on the AFM Video Camera (Components, 4

Pagina 14 - Contents of the Tool set

STORING THE INSTRUMENT21First all status lights on top of the Controller briefly light up. Then the Scan Head lights and the lights of the detected mo

Pagina 15 - The Scan head

INSTALLING THE EASYSCAN 2 AFM22Installing the Software- Check that the computer on which you want to install the software fulfils the requirements lis

Pagina 16 - The Controller

INSTALLING THE SOFTWARE23The setup program should start automatically. If this does not happen, pro-ceed as follows:- Open the easyScan 2 Installation

Pagina 17

INSTALLING THE EASYSCAN 2 AFM24- Choose ‘Automatic installation’.- Click the default choice in all dialogs.The USB High Speed Serial Converter is now

Pagina 18 - Installing the easyScan 2 AFM

INSTALLING THE SOFTWARE25Important!The easyScan 2 AFM Installation CD contains calibration information (.hed files) specific to your instrument, there

Pagina 19 - Module and Signal module: A

INSTALLING THE EASYSCAN 2 AFM26The red USB power light on the Controller should now light up, and the PC should now automatically detect the ‘USB Devi

Pagina 20 - Turning on the Controller

INITIALISING THE CONTROLLER27Preparing for MeasurementThis chapter describes actions that you perform on a day-to-day basis as a preparation for your

Pagina 21 - Storing the Instrument

PREPARING FOR MEASUREMENT28Installing the cantileverTo maximise ease of use, the Nanosurf easyScan 2 AFM is designed so that the cantilever can be ins

Pagina 22 - Installing the Software

INSTALLING THE CANTILEVER29operating mode; the more flexible, long CONTR cantilever is generally used for the static operating mode.When you change to

Pagina 24 - USB Video Adapter

PREPARING FOR MEASUREMENT30- Turn the scan-head upside-down.- Close the DropStop (figure Closing the DropStop).The laser beam is now blocked by the Dr

Pagina 25 - Important!

INSTALLING THE CANTILEVER31- Remove the DropStop.The laser beam is now unblocked, and the Probe Status light on the easy-Scan 2 Controller should now

Pagina 26 - INSTALLING THE EASYSCAN 2 AFM

PREPARING FOR MEASUREMENT32Installing the samplePreparing the SampleThe easyScan 2 AFM can be used to examine any material with a surface roughness th

Pagina 27 - Preparing for Measurement

INSTALLING THE SAMPLE33Calibration Sample KitThe samples supplied in the optional Calibration Sample kit are meant as test samples that can also be us

Pagina 28 - Installing the cantilever

PREPARING FOR MEASUREMENT34mounted on the sample stage. You can either put the sample directly on the sample stage, or mount it on the sample holder (

Pagina 29

INSTALLING THE SAMPLE35Important!Avoid all mechanical impact on the cantilever when placing the sample holder under the Scan head. Any impact will dam

Pagina 30 - Closing the DropStop

A FIRST MEASUREMENT36A First MeasurementIn this chapter, step by step instructions are given as to how to operate the microscope and make a simple mea

Pagina 31 - NSTALLING THE CANTILEVER

PREPARING THE INSTRUMENT37Preparing the instrumentImportant!• Never touch the cantilever or the surface of the sample! Good results rely heavily on a

Pagina 32 - Installing the sample

A FIRST MEASUREMENT38ing it with the Tab key.• The value of an activated parameter can be increased and decreased using the up and down arrow keys on

Pagina 33 - The sample stage

APPROACHING THE SAMPLE39Approaching the sampleTo start measuring, the tip must come within a fraction of a nanometer of the sample without touching it

Pagina 34 - Scan head on the Sample Stage

4 The easyScan 2 AFM 7Features...8easyScan 2 Controller

Pagina 35

A FIRST MEASUREMENT40The side view should look like figure Side view of the cantilever after manual coarse approach. You can use the cantilever as a r

Pagina 36 - A First Measurement

APPROACHING THE SAMPLE41grated optics. The tip should not come closer to the sample than a few times the cantilever width. (figure View of the cantile

Pagina 37 - Preparing the instrument

A FIRST MEASUREMENT42- If you are operating in Static Force mode, select a CONTR type canti-lever.In dynamic mode, the instrument will automatically d

Pagina 38 - A FIRST MEASUREMENT

STARTING A MEASUREMENT43- Select the ‘Easy level’ user interface mode.Now check that the set point and the feedback speed are set properly:- Click i

Pagina 39 - Approaching the sample

A FIRST MEASUREMENT44Reminder: Measurements on the micrometer/nanometer scale are very sen-sitive. Direct light, fast movements causing air flow and t

Pagina 40 - 1. Manual Coarse approach

SELECTING A MEASUREMENT AREA45- Click on one corner of the region using the left mouse button, and keep the button pressed.- Drag the mouse to the oth

Pagina 41 - 3. Automatic final approach

A FIRST MEASUREMENT46Storing the measurementWhen you are satisfied with your image and would like to keep it, you can take a snapshot of it by clickin

Pagina 42

FINISHING47For an in depth introduction to the Nanosurf Report software, refer to the Introduction section of the Nanosurf Report online help.Finishin

Pagina 43 - Starting a measurement

IMPROVING MEASUREMENT QUALITY48Improving measurement qualityRemoving interfering signalsInterfering signals can be recognised because they have a fixe

Pagina 44 - Selecting a measurement area

JUDGING MEASUREMENT QUALITY49Electrical interferenceElectrical interference may be caused by interference in the electronics, or by electrostatic forc

Pagina 45 - SELECTING A MEASUREMENT AREA

52. Manual approach using the approach stage 403. Automatic final approach 41Starting a measurement ...

Pagina 46 - Creating a report

IMPROVING MEASUREMENT QUALITY50In the following cases the cantilever has to be replaced in order to re-estab-lish high image quality:• images in the c

Pagina 47 - Finishing

ADJUSTING THE MEASUREMENT PLANE51Average, Plane fit or higher order filters can not be used.• The Z-Controller functions less accurately, because it h

Pagina 48 - Improving measurement quality

IMPROVING MEASUREMENT QUALITY52Ideally, the XY-plane of the scanner has already been correctly aligned with the sample plane using the three Levelling

Pagina 49 - Judging measurement quality

ADJUSTING THE MEASUREMENT PLANE53- Set Rotation to 90° to scan along the y-direction of the scanner.- If the scan line is not horizontal, alter the v

Pagina 50 - IMPROVING MEASUREMENT QUALITY

MEASUREMENT MODES54Measurement modesThis chapter instructs you on how to use the Dynamic Force, Static Force, Phase contrast, the Force Modulation, an

Pagina 51

DYNAMIC FORCE55Both the Force Modulation mode and the Spreading Resistance mode are an extension of the Static Force mode.The procedure for a first St

Pagina 52

MEASUREMENT MODES56vibration and a reference signal is measured. This phase shift changes when the resonance characteristic of the cantilever changes

Pagina 53

PHASE CONTRAST57Phase measurementIn Phase contrast mode, the phase of the measured cantilever vibration is compared to the phase of a reference sine w

Pagina 54 - Measurement modes

MEASUREMENT MODES58Force ModulationThe Force Modulation mode is an extension of the Static force mode. The static force acting on the cantilever is st

Pagina 55 - Phase Contrast

SPREADING RESISTANCE59- If necessary, increase the size of the window to make space for the new chart.- Select the ‘Color map’ chart type by .- Selec

Pagina 56 - MEASUREMENT MODES

TABLE OF CONTENTS6About this ManualThis manual gives instructions on how to set up and use your Nanosurf easyScan 2 AFM system. Installing the easySca

Pagina 57 - Phase measurement

MEASUREMENT MODES60ple.• EFM cantilevers cannot be used, due to their insufficient width.- Install the cantilever as described in section Installing t

Pagina 58 - Force Modulation

SIGNAL MODULE: S61The Signal ModulesThe Signal Modules consist of both electronics modules that are built into the Controller, and a break-out Connect

Pagina 59 - Spreading Resistance

THE SIGNAL MODULES62The calibration of the monitor signals can be found by looking up the sig-nal calibration in the Scan Head Calibration Dialog, rea

Pagina 60

SIGNAL MODULE: A63their signal names. The signal names and their function are listed in the tables Monitor Signals and Signal Module: A Signals.Signa

Pagina 61 - The Signal Modules

THE SIGNAL MODULES64The sum of the modulation inputs and the output value (for example of X-Axis) should not exceed the -10V - +10V range. The Excitat

Pagina 62 - Signal Module: A

SIGNAL MODULE: A65MaintenanceTo ensure fault free operation of the microscope the following instructions for maintenance have to be followed.Scan head

Pagina 63 - Signal Module: A Signals

PROBLEMS AND SOLUTIONS66Problems and SolutionsThe problems described here can occur during normal operation of the microscope. If the suggested course

Pagina 64 - THE SIGNAL MODULES

SIGNAL MODULE: A67- Change the cantilever if no improvement can be seen after these proce-dures.Set point driftWhen part of the scan line in the Line

Pagina 65 - Maintenance

PROBLEMS AND SOLUTIONS68The USB cable is not properly connected. In this case the USB power light on the Controller rear panel (figure The easyScan 2

Pagina 66 - Problems and Solutions

NANOSURF SUPPORT69only happens when measuring in Dynamic Force Mode.’• If an error message was displayed: The exact text of the message, or at least i

Pagina 67 - USB Port error

7 The easyScan 2 AFMThe Nanosurf easyScan 2 AFM is an atomic force microscope system that can make nanometer scale resolution measurements of topograp

Pagina 68 - Nanosurf support

AFM THEORY70AFM TheoryScanning Probe MicroscopyThe easyScan 2 AFM is an atomic force microscope, which is part of the family of scanning probe microsc

Pagina 69 - NANOSURF SUPPORT

THE NANOSURF EASYSCAN 2 AFM71damping of the cantilever vibration caused by the forces between the tip and the cantilever can be measured and used for

Pagina 70 - AFM Theory

AFM THEORY72In dynamic operating modes, the cantilever is excited using a piezo ele-ment. This piezo is oscillated with a fixed amplitude at an operat

Pagina 71 - The Nanosurf easyScan 2 AFM

THE NANOSURF EASYSCAN 2 AFM73Scanner coordinate systemxy

Pagina 72 - AFM THEORY

THE EASYSCAN 2 AFM8FeatureseasyScan 2 ControllerElectronicsSoftwareElectronics size / weight 470 x 120 x 80mm / 2.4kgPower supply 90 - 240V~/ 30W 50/6

Pagina 73 - Scanner coordinate system

FEATURES9Computer requirementsComputer not included with system.Nanosurf easyScan 2 Scripting InterfaceNanosurf easyScan 2 Signal Module: SNanosurf ea

Comentarios a estos manuales

Sin comentarios